Abstract
The authors demonstrate organic ferroelectric field effect transistors using poly(vinylidene fluoride-trifluoroethylene) as dielectric in bottom common gate and patterned gate devices. Drain current hysteresis is resulted from the dipole switching at channel region due to gate-source bias. For common gate device, an additional anomalous polarization switching is observed due to gate-drain bias. This switching has no effect on the hysteresis direction yet incurs a strong peak in the off drain current leading to unstable and uncontrollable off state in memory device. Reduction of gate-drain overlapping using patterned metal gate shows diminishing the anomalous switching hence improves performance of the ferroelectric transistors. © 2007 American Institute of Physics.
Cite
CITATION STYLE
Nguyen, C. A., Lee, P. S., Ng, N., Su, H., Mhaisalkar, S. G., Ma, J., & Boey, F. Y. C. (2007). Anomalous polarization switching in organic ferroelectric field effect transistors. Applied Physics Letters, 91(4). https://doi.org/10.1063/1.2757092
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