Abstract
The single crystal growth of 19 different intermetallic compounds within the LnT2X2 family (with Ln = lanthanides, T = Co, Ru, Rh, Ir, and X = Si, P) is presented, by employing a high-temperature metal-flux technique. The habitus of the obtained crystals is platelet-like with the crystallographic c direction perpendicular to the surface and with individual masses between 1 and 100 mg. The magnetic properties of these crystals are characterized by magnetization, heat-capacity, and resistivity measurements. These crystals form the materials basis for a thorough study of exciting surface properties by angle-resolved photoemission spectroscopy.
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Kliemt, K., Peters, M., Feldmann, F., Kraiker, A., Tran, D. M., Rongstock, S., … Krellner, C. (2020). Crystal Growth of Materials with the ThCr2Si2 Structure Type. Crystal Research and Technology, 55(2). https://doi.org/10.1002/crat.201900116
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