High energy excitation transfer from silicon nanocrystals to neodymium ions in silicon-rich oxide film

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Abstract

In this work, direct experimental evidence of the excitation energy transfer from silicon quantum dots (Si-QDs) to Nd ions has been given based on photoluminescence (PL) and PL excitation measurements in a wide spectral range. The indirect excitation of Nd ions by transfer from excited Si-QDs is possible and even more efficient at higher energy levels (I49/2 → D43/2, D45/2) than the indirect excitation reported up to now at lower energy (I49/2 → F43/2 - F47/2) levels. © 2010 The Electrochemical Society.

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Podhorodecki, A., Misiewicz, J., Gourbilleau, F., Cardin, J., & Dufour, C. (2010). High energy excitation transfer from silicon nanocrystals to neodymium ions in silicon-rich oxide film. Electrochemical and Solid-State Letters, 13(3). https://doi.org/10.1149/1.3279688

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