Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide content in Co80Pt20: Oxide thin films

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Abstract

Angle-dependent x-ray magnetic circular dichroism at the Co L2.3 edges has been utilized to systematically study Co80Pt 20:WO3 perpendicular magnetic recording thin films, in which the magnetocrystalline anisotropy significantly drops as the oxide volume fraction increases. The microscopic origin of this phenomenon in the studied films can be mainly attributed to an increase in orbital moment normal to the grain-oxide interface, with increasing oxide volume fraction, which arises from a more pronounced effect of symmetry breaking at the grain-oxide interface in smaller grains. © 2013 IOP Publishing Ltd.

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Zhang, W., Morton, S. A., Johnny Wong, P. K., Lu, B., Xu, Y., De Jong, M. P., … Van Der Laan, G. (2013). Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide content in Co80Pt20: Oxide thin films. Journal of Physics D: Applied Physics, 46(40). https://doi.org/10.1088/0022-3727/46/40/405001

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