Conference ProceedingsOPEN ACCESS

The 55th Design Automation Conference

IEEE Design and Test (2018) 35(5) 75-77
DOI: 10.1109/MDAT.2018.2862894
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Abstract

The 55th Design Automation Conference (DAC) was held at the Moscone Center West, San Francisco, CA, USA, on 24-28 June 2018. After 54 years, DAC continues to be the premier conference for design and design automation from chips to systems, where attendees learn today and create tomorrow.

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Hu, X. S. (2018). The 55th Design Automation Conference. In IEEE Design and Test (Vol. 35, pp. 75–77). IEEE Computer Society. https://doi.org/10.1109/MDAT.2018.2862894

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