Abstract
A new dislocation etchant for silver reliably reveals etch pits at both grown-in and fresh dislocations without decoration treatments. This etchant and the modified Levinstein-Robinson etchant are compared by detailed examination of the etch-pit morphology and the dislocation distribution patterns around microindentations. This etchant produces conical-shape etch pits and selectively etches only edge dislocations of one sign.
Cite
CITATION STYLE
APA
Chen, C. C., & Hendrickson, A. A. (1971). New dislocation etchant for silver. Journal of Applied Physics, 42(13), 5375–5378. https://doi.org/10.1063/1.1659952
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