Abstract
EM injection recently emerged as an effectivemedium for fault injection. This paper presents an analysisof the IC susceptibility to EM pulses. It highlights that faultsproduced by EM pulse injection are not timing faults butcorrespond to a different model which is presented in thispaper. This model also allows to explain experimental resultsintroduced in former communications.
Author supplied keywords
Cite
CITATION STYLE
APA
Ordas, S., Guillaume-Sage, L., & Maurine, P. (2016). EM injection: Fault model and locality. In Proceedings - 2015 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2015 (pp. 3–13). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/FDTC.2015.9
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
Already have an account? Sign in
Sign up for free