Abstract
We propose an enhanced selective compaction scheme, which integrates three techniques, called selectively filled tests, selective chains masking and selective chains observation, to reduce the impact of unknown values on the test response compaction ratio. Experimental results on several industrial designs demonstrate the effectiveness of the proposed scheme in achieving a very high test response compaction ratio without compromising the test quality. © 2005 IEEE.
Cite
CITATION STYLE
Tang, H., Wang, C., Rajski, J., Reddy, S. M., Tyszer, J., & Pomeranz, I. (2005). On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios. In Proceedings of the IEEE International Conference on VLSI Design (pp. 59–64). https://doi.org/10.1109/icvd.2005.127
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