Abstract
A new method is proposed for the imaging of the flux-line lattice of a type-II superconductor by soft X-ray absorption microscopy. It is shown that the method is very demanding but probably realisable in the foreseeable future. The new method has the potential to image in real space static and dynamical properties of the flux-line lattice at arbitrary external fields and with single-flux-line resolution. © 2005 International Union of Crystallography Printed in Great Britain - all rights reserved.
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Fähnle, M., Albrecht, J., Eimüller, T., Fischer, P., Goering, E., Steiauf, D., & Schütz, G. (2005). On the imaging of the flux-line lattice of a type-ll superconductor by soft X-ray absorption microscopy. In Journal of Synchrotron Radiation (Vol. 12, pp. 251–253). https://doi.org/10.1107/S0909049504028936
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