THz characterization of high dielectric-constant materials using double-layer sample

Abstract

A method of measurement of the real and imaginary parts of high dielectric constant materials at THz frequencies is described. The method is based on application of double-layer sample with variable distance between slabs. The recorded power transmittance inerferogram is employed for reconstructing complex permittivity of a material under test. Reconstructing algorithm and its realization are presented. Example of measurements of the alumina sample in 0.8-1.1 THz has demonstrated a good agreement with independent data obtained from the time-domain terahertz spectroscopy method. © 2007 Wiley Periodicals, Inc.