Journal Article

Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor

Journal of the American Chemical Society (2008) 130(9) 2762-2763
DOI: 10.1021/ja711478h
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Abstract

MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 °C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor(Pr0.9La0.1)2(Ni0.74Cu0.21Ga0.05)O4+δ. Copyright © 2008 American Chemical Society.

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APA

Yashima, M., Enoki, M., Wakita, T., Ali, R., Matsushita, Y., Izumi, F., & Ishihara, T. (2008). Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor. Journal of the American Chemical Society, 130(9), 2762–2763. https://doi.org/10.1021/ja711478h

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