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Planar position sensitive Ge(i)- and Si(Li)-detector systems for Compton Polarimetry in Atomic Physics with Highly Charged Ions

Journal of Physics: Conference Series (2012) 388(PART 14)
DOI: 10.1088/1742-6596/388/14/142023
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Abstract

Planar position-, energy-, and time-dispersive semiconductor detector systems have shown their excellent performance in Compton Polarimetry and X-ray Imaging in the realm of Atomic Physics Experiments with Highly Charged Ions. We report on two of these detector systems and discuss the importance of this kind of detector systems for the present and future experimental programm of the SPARC collaboration at GSI and FAIR.

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APA

Spillmann, U., Blumenhagen, K. H., Bräuning, H., Weber, G., & Stöhlker, T. (2012). Planar position sensitive Ge(i)- and Si(Li)-detector systems for Compton Polarimetry in Atomic Physics with Highly Charged Ions. In Journal of Physics: Conference Series (Vol. 388). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/388/14/142023

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