Thickness-dependent structural, spectral, linear, nonlinear and z-scan optical studies of V2O5 thin films prepared by a low-cost sol-gel spin coating technique

Abstract

Vanadium Pentoxide (V2O5) films were synthesized on a glass substrate by a spin coating method. The coated films were analyzed by XRD, UV-vis-NIR, SEM, EDX, and Raman Spectroscopy. SEM and EDX studies confirmed the surface and the elemental analysis of the prepared films. XRD studies confirmed the monoclinic crystalline structure of present films. The spectral studies were recorded by Raman spectroscopy. Optical properties such as transmission, absorption, and band gap analysis were done in the range of 190-2500 nm by UV-vis-NIR spectroscopy technique for different thickness of V2O5 thin films. The linear and nonlinear optical properties were analyzed systematically and reported. Further, Z-scan studies Viz., nonlinear refraction absorption index and third-order susceptibilities were studied in terms of thickness variation and their results were discussed. The results suggest that the prepared thin films have huge applications in linear and nonlinear optical devices and some other optoelectronic applications.