Resonant X-ray scattering study of hidden order in URu2Si 2 using a low-stress single crystal

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Abstract

We have studied a puzzling phase below 17.5 K of URu2Si 2 by means of resonant X-ray scattering (RXS) near the U M IV absorption edge (E ∼ 3.73 keV), using a high-quality single-crystalline sample with low residual stress. We reconfirm that a commensurate (003) superlattice reflection comes purely from antiferromegnetic dipolar order with ordering wave vector QAF = (1, 0, 0). No other traces of significant RXS have been detected in a major region of (h0l) plane, indicating absence of quadrupolar order within a searched Q range including a conceivable nesting vector Q* = (1.4, 0, 0). © 2010 IOP Publishing Ltd.

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Amitsuka, H., Inami, T., Yokoyama, M., Takayama, S., Ikeda, Y., Kawasaki, I., … Yanagisawa, T. (2010). Resonant X-ray scattering study of hidden order in URu2Si 2 using a low-stress single crystal. In Journal of Physics: Conference Series (Vol. 200). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/200/1/012007

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