Abstract
Synopsis The photoionization by short twisted XUV pulses (X-waves) is investigated in the presence of an intense infrared beam within the S-matrix formalism. It is demonstrated how sidebands are affected by the twist of the ionizing pulse as the pulse duration increases.
Cite
CITATION STYLE
APA
Böning, B., Paufler, W., & Fritzsche, S. (2017). Sideband and streaking regimes in two-color photoionization by twisted X-waves in strong infrared fields. In Journal of Physics: Conference Series (Vol. 875). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/875/3/022017
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