An advanced electric probing system: Measuring DNA derivatives

Abstract

An advanced electric probing system was developed to measure the electric properties of nanometer-scale samples. The resultant system is based on a conventional AFM with carbon nanotube (CNT) probes. Using this system, the I-V curves of λ-DNA and DNA-acceptor cross-linked derivatives (DACD) were measured. Two types of DACD were synthesized in order to inject holes into DNA. The I-V curves showed that the chemical doping increased conductance of DNA. Furthermore, electrical transport mechanism was explained through DACD with hopping model.