Enhanced lithographic resolution using longitudinal polarization state of light

  • Van M
  • Ushakova K
  • Bastiaansen C
  • et al.
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Abstract

© The Authors. Laser direct-writing is an important technique for the fabrication of complex patterns. There is a continuous need for structures with increasingly small features, i.e., enhanced resolution. Focused radially polarized light is known to exhibit a narrow longitudinal polarization component. Here, a proof-of-concept is shown of enhanced resolution through polarization-selectivity by the selective recording of the longitudinal polarization component in a polarization-selective homeotropic and smectic B photoresist. The full-width-at-half-maximum (FWHM) of the fabricated spots in the polarization-selective resist is up to 56% smaller compared to the FWHM of the same spot in a photoresist that is not polarization-selective, which supports simulations that predict a theoretical maximum reduction of 62%.

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APA

Van, M.-P., Ushakova, K., Bastiaansen, C. W. M., Pereira, S. F., Urbach, H. P., & Broer, D. J. (2015). Enhanced lithographic resolution using longitudinal polarization state of light. Journal of Micro/Nanolithography, MEMS, and MOEMS, 14(4), 043509. https://doi.org/10.1117/1.jmm.14.4.043509

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