Abstract
Apparatus and methods are described for measuring in the infrared the normal spectral emissivity of m etals a nd coatings or oxides which tightly adhere to metals. Examples of t he use of this a pparatus are givon in measurements of the emissivity of pl atinum a nd of ox idized Inconel within t he spectral region of 1.5 to 15 microns. Meas ured values were reproduced to better than 5 percent.
Cite
CITATION STYLE
Maki, A. G., Stair, R., & Johnston, R. G. (1960). Apparatus for the measurement of the normal spectral emissivity in the infrared. Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation, 64C(2), 99. https://doi.org/10.6028/jres.064c.013
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