Generalized charge sensitivity analysis

Abstract

Charge sensitivity analysis was originally introduced in the trivial-atom resolution. Here, we extend this resolution into force-field atoms. The AMBERff99 force-field resolution was employed. The effective electronegativities and hardnesses were derived for five different population analyses (Mulliken, Hirschfeld, AIM, NPA and Voronoi charges) by applying evolutionary algorithms. © 2012 Springer Science+Business Media, LLC.