Write-Combined Logging: An Optimized Logging for Consistency in NVRAM

Abstract

Nonvolatile memory (e.g., Phase Change Memory) blurs the boundary between memory and storage and it could greatly facilitate the construction of in-memory durable data structures. Data structures can be processed and stored directly in NVRAM. To maintain the consistency of persistent data, logging is a widely adopted mechanism. However, logging introduces write-twice overhead. This paper introduces an optimized write-combined logging to reduce the writes to NVRAM log. By leveraging the fast-read and byte-addressable features of NVRAM, we can perform a read-and-compare operation before writes and thus issue writes in a finer-grained way. We tested our system on the benchmark suit STAMP which contains real-world applications. Experiment results show that our system can reduce the writes to NVRAM by 3334, which can help extend the lifetime of NVRAM and improve performance. Averagely our system can improve performance by 711.