Abstract
The first CMOS active pixel sensor (APS) with onchip column-parallel successive-approximation analog-to-digital converter (ADC) is reported. A 64 × 64 element CMOS APS implemented in a 1.2-μm n-well single-poly double-metal process with 24-μm pixel pitch is integrated with a 64 × 1 array of column parallel successive approximation 8-b ADC's. Good image quality was observed. The capacitively-coupled ADC's dissipate approximately 1 μW-s/ksample and occupy 0.05 mm2 of chip area. © 1997 IEEE.
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CITATION STYLE
Zhou, Z., Pain, B., & Fossum, E. R. (1997). CMOS active pixel sensor with on-chip successive approximation analog-to-digital converter. IEEE Transactions on Electron Devices, 44(10), 1759–1763. https://doi.org/10.1109/16.628833
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