Journal ArticleOPEN ACCESS

Local Texture Measurements by EBSP. New Computer Procedures

  • Jensen D
  • Schmidt N
Texture, Stress, and Microstructure (1991) 14(1) 97-102
DOI: 10.1155/tsm.14-18.97
N/ACitations
Citations of this article
5Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

Two new computer procedures for analysis of electron back scattering patterns (EBSP) are presented. One is a semiautomatic procedure for on‐line analysis of EBSPs. The other is an image processing procedure for computer identification of bands in an EBSP. These two procedures may be combined for fully automatic indexing of EBSPs.

Cite

CITATION STYLE

APA

Jensen, D. J., & Schmidt, N. H. (1991). Local Texture Measurements by EBSP. New Computer Procedures. Texture, Stress, and Microstructure, 14(1), 97–102. https://doi.org/10.1155/tsm.14-18.97

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free