A maskless method of electron beam lithography is described which uses the reflection of an electron beam from an electrostatic mirror to produce caustics in the demagnified image projected onto a resist-coated wafer. By varying the electron optics, e.g. via objective lens defocus, both the morphology and dimensions of the caustic features may be controlled, producing a range of bright and tightly focused projected features. The method is illustrated for line and fold caustics and is complementary to other methods of reflective electron beam lithography. Copyright © 2012 Author(s).
CITATION STYLE
Kennedy, S. M., Zheng, C. X., Fu, J., Tang, W. X., Paganin, D. M., & Jesson, D. E. (2012). Electron caustic lithography. AIP Advances, 2(2). https://doi.org/10.1063/1.4730139
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