2D-ACAR studies on microstructure characteristics of porous silicon

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Abstract

Two dimensional electron momentum distributions (EMD) have been mapped by the two-dimensional angular correlation of positron annihilation radiation (2D-ACAR) to study the electronic structure and microstructural characteristics of porous silicon. The open volume defects associated with vacancies and their complexes present in the porous layer have been analysed using the EMD spectra. Also, the correlation between EMD and the pore formation mechanism was studied and the surface properties were analyzed along with the photoluminescence spectra. © 2007 WILEY-VCH Verlag GmbH & Co. KGaA.

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Sivaji, K., Sundar, C. S., Amarendara, G., Rajaraman, R., Padma, G., & Sankar, S. (2007). 2D-ACAR studies on microstructure characteristics of porous silicon. In Physica Status Solidi (C) Current Topics in Solid State Physics (Vol. 4, pp. 3654–3658). https://doi.org/10.1002/pssc.200675740

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