Electrical, electromechanical and thermal properties of thin tellurium films

Abstract

Thin films of tellurium of wide range of thicknesses have been deposited by vacuum evaporation and their electrical properties such as electrical resistivity and temperature coefficient of resistance have been measured. The suitability of these films for possible use as strain gauges has been studied and their strain resistivity behaviour is presented. The thermal conductivity of these films have been determined and these results are presented alongwith. An interesting phenomenon has been noticed. In all these effects an extraordinary behaviour is observed at a specific thickness. This smears out with an increase in the thickness of the film. These effects are explained in terms of size effects in thin films. © 1985 Indian Academy of Sciences.