Abstract
Various problems encountered in pattern recognition were examined by an eight-man panel during the Thursday afternoon session. The panel included O. G. Selfridge, M.I.T. Lincoln Laboratory, Session Chairman; R. A. Kirsch, National Bureau of Standards; M. Minsky, Massachusett Institute of Technology; U. Neisser, Brandeis University; and the authors of the four preceding papers — R. J. Evey, I.B.M. Corporation, “Use of a Computer to Design Character Recognition Logic;” R. L. Mattson, Lockheed Missiles an Space Division, “A Self-Organizing Binary System;” J. S. Bomba, Bell Telephone Laboratories, “Alpha-Numeric Character Recognition Using Local Operations;” and W.W. Bledsoe and I. Browning, Sandia Corporation, “Patter Recognition and Reading by Machine.” Following comments by Messrs. Kirsch, Minsky and Neisser, the panelists answered a number of questions from members of the audience.
Cite
CITATION STYLE
Bledsoe, W. W., Bomba, J. S., Browning, I., Evey, R. J., Kirsch, R. A., Mattson, R. L., … Selfridge, O. G. (1959). Discussion of problems in pattern recognition. In Proceedings of the Eastern Joint Computer Conference, IRE-AIEE-ACM 1959 (pp. 233–237). Association for Computing Machinery, Inc. https://doi.org/10.1145/1460299.1460327
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