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Rapid Multiplex Ultrafast Nonlinear Microscopy for Advanced Material Characterization

2023 Conference on Lasers and Electro-Optics, CLEO 2023 (2023)
DOI: 10.1364/cleo_si.2023.sm4h.2
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Abstract

We demonstrate rapid four-wave mixing (FWM) imaging to assess the quality of emerging optical and electronic materials. We show that FWM intensity, dephasing times, and excited state lifetimes are accurate sample quality indicators.

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Purz, T. L., Hipsley, B. T., Martin, E. W., Ulbricht, R., & Cundiff, S. T. (2023). Rapid Multiplex Ultrafast Nonlinear Microscopy for Advanced Material Characterization. In 2023 Conference on Lasers and Electro-Optics, CLEO 2023. Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1364/cleo_si.2023.sm4h.2

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