Total reflection X-ray fluorescence analysis of the rare earth elements by K-shell excitation

Abstract

Excitation of samples in total reflection geometry using an energy-dispersive spectrometer system for the detection of characteristic X-rays has proved to be a very efficient technique for trace element analysis. The applicability of total reflection X-ray fluorescence (TXRF) to higher energies necessary to excite the K-shells of the rare earth elements (REE) could also be shown. This approach seems to be advantageous compared to many other analytical methods for REE analysis, because all elements present in small amounts ( μg ml-range) within liquid samples ({reversed tilde equals}5 μl) can be quantified. A new collimation system and reflector shape are introduced. © 1991.