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Defect formation on BaF2 by single impact of highly charged ions

Journal of Physics: Conference Series (2012) 388(PART 13)
DOI: 10.1088/1742-6596/388/13/132033
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Abstract

The impact of highly charged ions on freshly cleaved BaF2 (100) surfaces produces areas with a high amount of defects. In order to make these defect agglomerates visible, they are etched chemically and analysed with contact atomic force microscopy. © Published under licence by IOP Publishing Ltd.

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Facsko, S., El-Said, A. S., Wilhelm, R., & Heller, R. (2012). Defect formation on BaF2 by single impact of highly charged ions. In Journal of Physics: Conference Series (Vol. 388). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/388/13/132033

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