Soft X-ray angle-resolved photoemission study of YbCu2Ge 2

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Abstract

Soft X-ray photoemission spectroscopies have been performed on YbCu 2Ge2, which is thought to be a Yb divalent system, to investigate its bulk electronic structure including Yb 4f electrons. Small but finite Yb3+ multiplet peaks were found at 6-12 eV in the angle-integrated spectrum, suggesting that it is a valence fluctuation compound. An "anti-crossing" Yb 4f bands with conduction bands were observed in the angle-resolved spectrum. This is the evidence that the Yb 4f electrons form a band state through the hybridization with Ge 4p and Cu 3d electrons. © Published under licence by IOP Publishing Ltd.

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Yasui, A., Fujimori, S. I., Kawasaki, I., Okane, T., Takeda, Y., Saitoh, Y., … Onuki, Y. (2011). Soft X-ray angle-resolved photoemission study of YbCu2Ge 2. In Journal of Physics: Conference Series (Vol. 273). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/273/1/012067

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