Journal Article

Interferometric characterization of 160 fs far-infrared light pulses

Applied Physics Letters (1991) 59(8) 893-895
DOI: 10.1063/1.105268
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Abstract

We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm-1.

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Greene, B. I., Federici, J. F., Dykaar, D. R., Jones, R. R., & Bucksbaum, P. H. (1991). Interferometric characterization of 160 fs far-infrared light pulses. Applied Physics Letters, 59(8), 893–895. https://doi.org/10.1063/1.105268

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