Resurf p-n diode with a buried layer, a comprehensive study

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Abstract

In this paper, important parameters of the p-buried layer of a high-voltage reduced surface field p-n diode are analyzed and discussed in terms of effects on device performance, including breakdown voltage and specific turn-on resistance, Ron,sp. Guidelines for optimizing the vertical position, lateral location, and doping concentration of the p-buried layer are suggested. The experimental results demonstrate that the p-n diode with the proposed p-buried layer optimization design can improve breakdown voltage by 30.7% but only increases 2.7% in specific on-resistance Ron,sp. © 1963-2012 IEEE.

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Yang, F. J., Gong, J., Su, R. Y., Tsai, C. L., Tuan, H. C., & Huang, C. F. (2013). Resurf p-n diode with a buried layer, a comprehensive study. IEEE Transactions on Electron Devices, 60(11), 3835–3841. https://doi.org/10.1109/TED.2013.2283582

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