Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future

R Livengood; S Tan; P Hack; M Kane; Y Greenzweig

Journal ArticleOPEN ACCESS

Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future

Livengood R
Tan S
Hack P
et al.

Microscopy and Microanalysis (2011) 17(S2) 672-673

DOI: 10.1017/s1431927611004235

N/ACitations

6Readers

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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CITATION STYLE

APA

Livengood, R., Tan, S., Hack, P., Kane, M., & Greenzweig, Y. (2011). Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future. Microscopy and Microanalysis, 17(S2), 672–673. https://doi.org/10.1017/s1431927611004235

Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future

Abstract

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