Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
CITATION STYLE
Livengood, R., Tan, S., Hack, P., Kane, M., & Greenzweig, Y. (2011). Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future. Microscopy and Microanalysis, 17(S2), 672–673. https://doi.org/10.1017/s1431927611004235
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