Convergent-beam electron diffraction (CBED) methods to determine the displacement vector of a stacking fault, the Burgers vector of a dislocation and the orientation difference between two domains adjoining at a coherent twin boundary are described. © 1991 Oxford University Press.
CITATION STYLE
Tanaka, M., Terauchi, M., & Kaneyama, T. (1991). Identification of lattice defects by convergent-beam electron diffraction. Journal of Electron Microscopy, 40(4), 211–220. https://doi.org/10.1093/oxfordjournals.jmicro.a050898
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