Statistical analysis of spatial point patterns on deep seismic reflection data: A preliminary test

Abstract

Spatial point patterns generated from bitmaps of images of processed reflection seismic profiles are analysed to quantify the reflectivity patterns. The point process characteristics for two different regions of a deep seismic reflection profile in northwestern Canada demonstrate that in both cases the points are not randomly distributed and that the point pattern distribution is different between the regions. The cluster effects for small point pair distances are stronger for the region of data where there is strong sedimentary layering than for the region where the layering is less distinct. As a result, it appears that future developments in point pattern analysis may provide a new tool for analysing spatial variations in reflection data. © 2007 The Authors Journal compilation © 2007 RAS.