Journal Article

Variable-temperature scanning optical and force microscope

Review of Scientific Instruments (2004) 75(9) 2971-2975
DOI: 10.1063/1.1784560
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Fodor, P. S., Zhu, H., Patil, N. G., & Jevy, J. (2004). Variable-temperature scanning optical and force microscope. Review of Scientific Instruments, 75(9), 2971–2975. https://doi.org/10.1063/1.1784560

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