Oriented growth of thin films of samarium oxide by MOCVD

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Abstract

Thin Films of Sm2O3 have been grown on Si(100) and fused quartz by low-pressure chemical vapour deposition using an adducted β-diketonate precursor. The films on quartz are cubic, with no preferred orientation at lower growth temperatures (∼ 550°C), while they grow with a strong (111) orientation as the temperature is raised (to 625°C). On Si(100), highly oriented films of cubic Sm2O3 at 625°C, and a mixture of monoclinic and cubic polymorphs of Sm 2O3 at higher temperatures, are formed. Films grown on either substrate are very smooth and fine-grained. Infrared spectroscopic study reveals that films grown above 600°C are free of carbon.

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Shalini, K., & Shivashankar, S. A. (2005). Oriented growth of thin films of samarium oxide by MOCVD. Bulletin of Materials Science. Indian Academy of Sciences. https://doi.org/10.1007/BF02711172

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