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Filamentary conduction in VO2 coplanar thin-film devices

Applied Physics Letters (1971) 19(4) 115-117
DOI: 10.1063/1.1653835
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Abstract

Filaments have been observed in VO2 coplanar thin-film devices and their I-V characteristic investigated. An analysis of the evolution of the temperature profile in the VO2 film is given. © 1971 The American Institute of Physics.

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Duchene, J., Terraillon, M., Pailly, P., & Adam, G. (1971). Filamentary conduction in VO2 coplanar thin-film devices. Applied Physics Letters, 19(4), 115–117. https://doi.org/10.1063/1.1653835

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