Abstract
Transition metal dichalcogenides (TMDCs), such as MoS2, are promising candidates for optoelectronic or catalytic applications. On that account, a detailed characterization of the electronic dynamics in these materials is of pivotal importance. Here, we investigate the temporal evolution of an excited carrier population by all-optical pump-probe spectroscopy. On the sub-picosecond time scale we observe thermal relaxation of the excited carriers by electron-phonon coupling. The dynamics on the nanosecond time scale can be understood in terms of defect-assisted Auger recombination over a broad carrier density regime spanning more than one order of magnitude. Hence, our results emphasize the importance of defect states for electronic processes in TMDCs at room temperature.
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Völzer, T., Lütgens, M., Fennel, F., & Lochbrunner, S. (2017). Recombination dynamics of optically excited charge carriers in bulk MoS2. Journal of Physics B: Atomic, Molecular and Optical Physics, 50(19). https://doi.org/10.1088/1361-6455/aa89df
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