Stochastic analysis and uncertainty assessment of tsunami wave height using a random source parameter model that targets a Tohoku-type earthquake fault

64Citations
Citations of this article
49Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

We created a fault model with a Tohoku-type earthquake fault zone having a random slip distribution and performed stochastic tsunami hazard analysis using a logic tree. When the stochastic tsunami hazard analysis results and the Tohoku earthquake observation results were compared, the observation results of a GPS wave gauge off the southern Iwate coast indicated a return period equivalent to approximately 1,709 years (0.50 fractile), and the observation results of a GPS wave gauge off the shore of Fukushima Prefecture indicated a return period of 600 years (0.50 fractile). Analysis of the influence of the number of slip distribution patterns on the results of the stochastic tsunami hazard analysis showed that the number of slip distribution patterns considered greatly influenced the results of the hazard analysis for a relatively large wave height. When the 90 % confidence interval and coefficient of variation of tsunami wave height were defined as an index for projecting the uncertainty of tsunami wave height, the 90 % confidence interval was typically high in locations where the wave height of each fractile point was high. At a location offshore of the Boso Peninsula of Chiba Prefecture where the coefficient of variation reached the maximum, it was confirmed that variations in maximum wave height due to differences in slip distribution of the fault zone contributed to the coefficient of variation being large.

Cite

CITATION STYLE

APA

Fukutani, Y., Suppasri, A., & Imamura, F. (2015). Stochastic analysis and uncertainty assessment of tsunami wave height using a random source parameter model that targets a Tohoku-type earthquake fault. Stochastic Environmental Research and Risk Assessment, 29(7), 1763–1779. https://doi.org/10.1007/s00477-014-0966-4

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free