Time-of-arrival detection for time-resolved scanning transmission X-ray microscopy imaging

Abstract

A setup for time-resolved scanning transmission X-ray microscopy imaging is presented, which allows for an increase in the temporal resolution without the requirement of operating the synchrotron light source with low-α optics through the measurement of the time-of-arrival of the X-ray photons. Measurements of two filling patterns in hybrid mode of the Swiss Light Source are presented as a first proof-of-principle and benchmark for the performances of this new setup. From these measurements, a temporal resolution on the order of 20-30 ps could be determined.