Near-field microscope probe for far infrared time domain measurements

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Abstract

A near-field probe fabrication technique for far-infrared frequencies based on photoconducting antennas is developed. A subwavelength-size field source is accomplished by means of an aperture and protruding high refractive index tip. The near-field probe is tested by using free space traveling electromagnetic pulses with a broadband spectrum in the range of 0.3-1.5 THz. A spatial resolution of 60 μm is achieved for a 50 μm aperture. The described probe may be used for near-field transmission microscopy in illumination and collection modes. Resolution may be further improved by means of a smaller aperture. © 2000 American Institute of Physics. [S0003-6951(00)04630-1].

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Mitrofanov, O., Brener, I., Wanke, M. C., Ruel, R. R., Wynn, J. D., Bruce, A. J., & Federici, J. (2000). Near-field microscope probe for far infrared time domain measurements. Applied Physics Letters, 77(4), 591–593. https://doi.org/10.1063/1.127054

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