Abstract
A localized nanoplasmonic induced absorption enhancement in silicon nitride (Si3N4) dielectric material using a nanoscale novel checkerboard gold (Au) structure is demonstrated. The checkerboard structure is fabricated on a Si3N4 layer using electron-beam lithography and sputter deposition techniques. The plasmonic electric field and optical absorption enhancement are measured using scanning near-field optical microscopy. Finite-difference time-domain simulations are utilized to characterize the absorption spectral response enhancement together with its dependence on incidence angle and polarization. The checkerboard shows a broadband average spectral absorption enhancement of 63.2% over the wavelength range 8-12 μm with a maximum enhancement of 107% at 8 μm and a minimum enhancement of 24.8% at 12 μm. The degradation of enhanced absorption with incidence angle variation (0°-60°) is less than 1.6% at 10.6-μm wavelength. The checkerboard device shows polarization-independent absorption enhancement with incidence angles.
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Awad, E., Abdel-Rahman, M., & Fakhar Zia, M. (2014). Checkerboard Nanoplasmonic Gold Structure for Long-Wave Infrared Absorption Enhancement. IEEE Photonics Journal, 6(4). https://doi.org/10.1109/JPHOT.2014.2345879
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