On the importance of onset times and multiple-wavelength analysis of photoluminescence decays

Abstract

The characterization of photoluminescence (PL) decay is a very basic optical measurement. In this article, we propose a straightforward yet effective procedure to analyze PL decays measured at multiple wavelengths at once, using a time-gated CCD or a streak camera. In our procedure, we make sure to include the onset edge of the PL decay, because its omission can significantly reduce the quality of the analysis and propose a way to accurately determine this parameter.