X-ray Tomographic Microscopy at TOMCAT

Abstract

Synchrotron-based X-ray Tomographic Microscopy is a powerful technique for fast non-destructive, high resolution quantitative volumetric investigations on diverse samples. At the TOMCAT (TOmographic Microscopy and Coherent rAdiology experimenTs) beamline at the Swiss Light Source, synchrotron light is delivered by a 2.9 T superbend. The main optical component, a Double Crystal Multilayer Monochromator, covers an energy range between 8 and 45 keV. The standard TOMCAT detector offers field of views ranging from 0.75×0.75 mm2 up to 12.1×12.1 mm2 with a pixel size of 0.37 μm and 5.92 μm, respectively. In addition to routine measurements, which exploit the absorption contrast, the high coherence of the source also enables phase contrast tomography, implemented with two complementary techniques (Modified Transport of Intensity approach and Grating Interferometry). Typical acquisition times for a tomogram are in the order of few minutes, ensuring high throughput and allowing for semi-dynamical investigations. Raw data are automatically post-processed online and full reconstructed volumes are available shortly after a scan with minimal user intervention. © 2009 IOP Publishing Ltd.