Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging

Abstract

Multi-lateral shearing interferometry [1] is an evolution of the classical lateral shearing interferometry: a grating based technique used for optical testing. Firstly developed for adaptive optics, for ultra-intense lasers characterization, or for lens testing, in visible or infrared, it has now been applied to visible quantitative phase microscopy of biological samples. The purpose of this paper is to present the transfer of this technique to the X-ray domain, stressing on the basic property of propagation invariance. © 2012 American Institute of Physics.