Bragg coherent diffraction imaging of epitaxial nanostructures using focused hard X-ray ptychography

Abstract

We present a data collection approach for nanofocused Bragg coherent x-ray diffraction imaging (CXDI), a technique that can extend the resolution of x-ray nanoprobes and isolate individual nanostructures for study. Nanofocused Bragg CXDI uses hard x-rays focused to <100nm to measure volumetric diffraction peaks with curved phase illumination. Here, we discuss the experimental challenges associated with this measurement and present the first coherent Bragg volumes measured from an individual β-Bi2O3 epitaxial nanocrystal. © 2011 American Institute of Physics.