Spectroscopic ellipsometry as a route to thermodynamic characterization

Abstract

Strategies for synthesizing molecularly designed materials are expanding, but methods for their thermodynamic characterization are not. This shortfall presents a challenge to the goal of connecting local molecular structure with material properties and response. Fundamental thermodynamic quantities, including the thermal expansion coefficient, α, can serve as powerful inputs to models, yielding insight and predictive power for phenomena ranging from miscibility to dynamic relaxation. However, the usual routes for thermodynamic characterization often require a significant sample size (e.g. one gram), or challenging experimental set-ups (e.g. mercury as a confining fluid), or both. Here, we apply spectroscopic ellipsometry, which is an optical technique for thin film analysis, to obtain thermodynamic data. We clarify issues in the scientific literature concerning the connection between ellipsometric and volumetric thermal expansion coefficients for substances in both the glass and melt states. We analyze temperature-dependent data derived using both ellipsometry and macro-scale dilatometric techniques for ten different polymers. We find superb correlation between the α values obtained via the two techniques, after considering the effects of mechanical confinement by the substrate for a glassy thin film. We show how the ellipsometric α can serve as input to the locally correlated lattice theory to yield predictions for the percent free volume in each polymer as a function of temperature. We find that the ellipsometric α at the glass transition temperature, Tg, is not only material dependent, but it is linearly correlated with Tg itself. Spectroscopic ellipsometry, which requires only very small quantities of sample and is straightforward to perform, will significantly expand the range of systems for which thermodynamic properties can be characterized. It will thus advance our ability to use theory and modeling to predict the miscibility and dynamic relaxation of new materials. As such, ellipsometry will be able to underpin materials synthesis and property design.