Enhancing electrostatic coupling in silicon quantum dot array by dual gate oxide thickness for large-scale integration

  • Lee N
  • Tsuchiya R
  • Shinkai G
  • et al.
N/ACitations
Citations of this article
22Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

We propose a structure with word/bit line control for a two-dimensional quantum dot array, which allows random access for arbitrary quantum dots with a small number of control signals. To control multiple quantum dots with a single signal, every quantum dot should have a wide operating voltage allowance to overcome the property variations. We fabricate two-dimensional quantum dot arrays using silicon-complementary-metal-oxide-semiconductor technology with an alternating dual-standard gate oxide thickness. The quantum dots are designed to have an allowable operating voltage window of 0.2 V to control the number of electrons, which is a window one order of magnitude wider than that of previous works. The proposed structure enables both easy fabrication and operation for multiple quantum dots and will pave the way for practical use of large-scale quantum computers.

Cite

CITATION STYLE

APA

Lee, N., Tsuchiya, R., Shinkai, G., Kanno, Y., Mine, T., Takahama, T., … Mizuno, H. (2020). Enhancing electrostatic coupling in silicon quantum dot array by dual gate oxide thickness for large-scale integration. Applied Physics Letters, 116(16). https://doi.org/10.1063/1.5141522

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free