Abstract
During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
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Bosser, A., Gupta, V., Tsiligiannis, G., Javanainen, A., Kettunen, H., Puchner, H., … DIlillo, L. (2015). Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. In IEEE Transactions on Nuclear Science (Vol. 62, pp. 2620–2626). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/TNS.2015.2496874
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